14 August 2012
Bruker today announced the release of the Photoconductive Atomic Force Microscopy (pcAFM) module for its Dimension Icon platform. The new accessory enables sample illumination while performing nano-scale electrical characterisation.
In conjunction with Bruker's exclusive PeakForce Tuna technology, the pcAFM module enables high-resolution photoconductivity and correlated nano-mechanical mapping for research on fragile organic light-emitting diode (OLED) and organic photovoltaic (OPV) device samples. The accessory is compatible with Bruker's turnkey 1 part per million (ppm) glove-box configuration, addressing the stringent environmental control needs of organic photoelectric materials and ensuring that measurements are not compromised by environmental material degradation.
The Dimension Icon pcAFM accessory is a modular addition to the Dimension Icon platform designed to retain the system's high level of performance while enabling photoconductivity measurements on OLEDs, OPVs and other photoelectric materials. It provides uniform backside sample illumination and can be fibre-coupled to industry-standard solar simulators. In combination with Bruker's PeakForce Tuna, the pcAFM addresses the key challenge of avoiding sample damage to fragile OLED and OPV samples, thus retaining high spatial-resolution photoconductivity data.
The PeakForce Tuna module enables conductivity mapping on fragile samples, such as OPVs, lithium-ion (Li-ion) cathodes and carbon nano-tube assemblies, while eliminating sample damage and tip contamination.
